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Solid State Characterization: Techniques, Standards, and Verified Data—An Integrated Lens for CMC Development

A concise overview of core methods (XRPD, DVS, PLM, PSD) plus four practical case studies illustrating how to diagnose amorphous vs. crystalline states, differentiate polymorphs, deconvolute agglomeration, and capture humidity-driven phase changes.


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NJ Sites: Suite 500-B, 3000 Eastpark Blvd, Cranbury, New Jersey, USA 08512
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bd_global@crystalpharmatech.com +1-609-604-8303
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